Informations

Stand number

E94

Exhibition class

A: Mechanics – Engines – Machinery – Tools – Industrial processes – Metallurgy

Technical description

A fast, non-destructive apparatus using grazing-incidence X-ray scattering (GIXS) detects defects in large-area polycrystalline thin films, enabling precise quantification and high-resolution mapping to enhance film quality and boost product yields.

Simplified description

This new method uses a technique called grazing-incidence X-ray scattering (GIXS) to quickly and safely find defects in large polycrystalline thin films. It allows for accurate measurement of the film's quality and creates detailed maps of its properties without causing any damage.